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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">dan</journal-id><journal-title-group><journal-title xml:lang="ru">Доклады Национальной академии наук Беларуси</journal-title><trans-title-group xml:lang="en"><trans-title>Doklady of the National Academy of Sciences of Belarus</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">1561-8323</issn><issn pub-type="epub">2524-2431</issn><publisher><publisher-name>The Republican Unitary Enterprise Publishing House "Belaruskaya Navuka"</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.29235/1561-8323-2019-63-6-672-679</article-id><article-id custom-type="elpub" pub-id-type="custom">dan-813</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>ФИЗИКА</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>PHYSICS</subject></subj-group></article-categories><title-group><article-title>Углы Брюстера для диссипативной пленочной структуры</article-title><trans-title-group xml:lang="en"><trans-title>Brewster angles for a dissipative film structure</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Сотский</surname><given-names>А. Б.</given-names></name><name name-style="western" xml:lang="en"><surname>Sotsky</surname><given-names>A. B.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Сотский Александр Борисович – д-р физ.-мат. наук, профессор. </p><p>ул. Космонавтов, 1, 212022, Могилёв</p></bio><bio xml:lang="en"><p>Sotsky Alexander Borisovich – D. Sc. (Physics and Mathematics), Professor.</p><p>1, Kosmonavtov Str. 212022, Mogilev</p></bio><email xlink:type="simple">ab_sotsky@mail.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Михеев</surname><given-names>С. С.</given-names></name><name name-style="western" xml:lang="en"><surname>Miheev</surname><given-names>S. S.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Михеев Сергей Сергеевич – аспирант. </p><p>ул. Космонавтов, 1, 212022, Могилёв</p></bio><bio xml:lang="en"><p>Miheev Sergey Sergeevich – Postgraduate student. </p><p>1, Kosmonavtov Str. 212022, Mogilev</p></bio><email xlink:type="simple">mikheev_msu@mail.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Назаров</surname><given-names>М. М.</given-names></name><name name-style="western" xml:lang="en"><surname>Nazarov</surname><given-names>M. M.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Назаров Максим Михайлович – канд. физ.-мат. наук, заведующий лабораторией. </p><p>пл. Академика Курчатова, 1, 123182, Москва</p></bio><bio xml:lang="en"><p>Nazarov Maxim Mikhailovich – Ph. D. (Physics and Mathematics), Head of the Laboratory.</p><p>1, Academician kurchatov Square, 123182, Moscow</p></bio><email xlink:type="simple">nazarovmax@mail.ru</email><xref ref-type="aff" rid="aff-2"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>Могилевский государственный университет им. А. А. Кулешова</institution></aff><aff xml:lang="en"><institution>Mogilev State A. kuleshov University</institution></aff></aff-alternatives><aff-alternatives id="aff-2"><aff xml:lang="ru"><institution>Национальный исследовательский центр «Курчатовский институт»</institution></aff><aff xml:lang="en"><institution>National Research Center “Kurchatov Institute”</institution></aff></aff-alternatives><pub-date pub-type="collection"><year>2019</year></pub-date><pub-date pub-type="epub"><day>04</day><month>01</month><year>2020</year></pub-date><volume>63</volume><issue>6</issue><fpage>672</fpage><lpage>679</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Сотский А.Б., Михеев С.С., Назаров М.М., 2020</copyright-statement><copyright-year>2020</copyright-year><copyright-holder xml:lang="ru">Сотский А.Б., Михеев С.С., Назаров М.М.</copyright-holder><copyright-holder xml:lang="en">Sotsky A.B., Miheev S.S., Nazarov M.M.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://doklady.belnauka.by/jour/article/view/813">https://doklady.belnauka.by/jour/article/view/813</self-uri><abstract><p>Определены условия обращения в ноль коэффициентов отражения плоских волн ТМ, либо ТЕ поляризации для диссипативной структуры пленка–подложка. С их использованием установлены возможности максимизации чувствительности измерений методом терагерцовой спектроскопии концентрации протеина в водном растворе и получено аналитическое решение обратной оптической задачи об определении комплексной диэлектрической проницаемости и толщины слабо поглощающей пленки, находящейся на слабо поглощающей подложке.</p></abstract><trans-abstract xml:lang="en"><p>The conditions of converting the reflection coefficients of plane TM or TE for a film-substrate dissipative structure are determined. As a result, the possibilities to maximize the measurement sensitivity by the THz spectroscopy method of the protein concentration in an aqueous solution are established, and the analytical solution to the inverse optical problem of determining the complex permittivity and thickness of a weakly absorbing film located on a weakly absorbing substrate is obtained.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>закон Брюстера</kwd><kwd>терагерцовый сенсор</kwd><kwd>водный раствор протеина</kwd><kwd>обратная оптическая задача</kwd><kwd>пленка на подложке</kwd></kwd-group><kwd-group xml:lang="en"><kwd>Brewster’s law</kwd><kwd>terahertz sensor</kwd><kwd>protein aqueous solution</kwd><kwd>inverse optical problem</kwd><kwd>film on substrate</kwd></kwd-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Борн, М. Основы оптики / М. Борн, Э. 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