Influence of the probe spring constant and the quality factor on its oscillation characteristics in dynamic mode of atomic force microscopy
https://doi.org/10.29235/1561-8323-2024-68-6-513-518
Abstract
The work presents the results of mathematical simulation of dynamic atomic force microscopy (AFM). Influences of spring constant, the quality factor of AFM-probe on its vibration amplitude and phase shifts are studied for semi-contact interaction of tip probe and sample surface. The deformation depths of sample by probe are calculated. Also the influence of oscillation amplitude of piezogenerator, which forces probe vibration, on the characteristics of probe oscillation is shown.
Keywords
atomic force microscopy,
AFM,
dynamic mode,
probe,
oscillation,
the Johnson–Kendall–Roberts model,
probe spring constant,
the probe quality factor,
oscillation amplitude of piezogenerator,
deformation depth of material
Supporting agencies: The work is performed within the framework of the project 3.03.3 of the State program of scientific research “Convergence–2025” for 2021–2025.
About the Authors
S. O. Abetkovskaia
A. V. Luikov Heat and Mass Transfer Institute of the National Academy of Sciences of Belarus
Belarus
Belarus
Abetkovskaia Sviatlana O. – Researcher
15, P. Brovka Str., 220072, Minsk
S. A. Chizhik
A. V. Luikov Heat and Mass Transfer Institute of the National Academy of Sciences of Belarus
Belarus
Belarus
Chizhik Sergei A. – Academician, D. Sc. (Engineering), Professor, Head of the Department
15, P. Brovka Str., 220072, Minsk
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