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Brewster angles for a dissipative film structure

https://doi.org/10.29235/1561-8323-2019-63-6-672-679

Abstract

The conditions of converting the reflection coefficients of plane TM or TE for a film-substrate dissipative structure are determined. As a result, the possibilities to maximize the measurement sensitivity by the THz spectroscopy method of the protein concentration in an aqueous solution are established, and the analytical solution to the inverse optical problem of determining the complex permittivity and thickness of a weakly absorbing film located on a weakly absorbing substrate is obtained.

About the Authors

A. B. Sotsky
Mogilev State A. kuleshov University
Belarus

Sotsky Alexander Borisovich – D. Sc. (Physics and Mathematics), Professor.

1, Kosmonavtov Str. 212022, Mogilev



S. S. Miheev
Mogilev State A. kuleshov University
Belarus

Miheev Sergey Sergeevich – Postgraduate student. 

1, Kosmonavtov Str. 212022, Mogilev



M. M. Nazarov
National Research Center “Kurchatov Institute”
Russian Federation

Nazarov Maxim Mikhailovich – Ph. D. (Physics and Mathematics), Head of the Laboratory.

1, Academician kurchatov Square, 123182, Moscow



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ISSN 1561-8323 (Print)
ISSN 2524-2431 (Online)